A finite difference time domain (FDTD) method is developed and applied to the problem of determining the transient electromagnetic fields surrounding typial structures that occur in a segmented metallised thin film capacitor. THE FDTD method developed in Java, for simulating the electromagnetic field is described.

The code enabled us to look at small segments of the capacitor structure. For example we can look at one pair or two pairs of plates in isolation. Through charging the plates and then simulating the discharge through a conducting channel, we are able to follow the consequence of discharge. The method is applied to a typical test case and results are given.

The Java codes used in this simulation can now be downloaded from www.electromagnetics.info/fdtd .